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Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

    Buy cheap Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber from wholesalers
     
    Buy cheap Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber from wholesalers
    • Buy cheap Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber from wholesalers

    Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

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    Brand Name : Haida
    Model Number : HD-512-NAND
    Price : 5000-12000 USD
    Payment Terms : L/C, D/A, D/P, T/T, Western Union, MoneyGram
    Supply Ability : 150 Sets/Months
    Delivery Time : 30 Days After Order
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    Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

    Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber


    product Specification

    Flash memory chip intelligent test system HD-512-NAND is a comprehensive flash memory test system that can customize the test plan and support parallel testing of various types of flash memory particles. 64 types, the maximum number of flash memory particles in parallel testing can reach 512.


    Flash memory chip intelligent test system YC-512-NAND supports multiple test patterns and custom test parameter functions, and can provide one-click basic test process and high-level test process with high flexibility, not only can realize the remaining life of flash memory particles, actual measurement , data retention and read interference and other functional tests can also help users verify the reliability status of flash memory particles. After the test is completed, the test report can be easily and quickly exported with one key, providing customers with the most intuitive and accurate graphical test data. Provide the most intuitive data reference for the grade classification and application of flash memory particles, and realize intelligent classification based on the quality inspection results of flash memory particles.


    ※ The test basis complies with JEDEC Stand No.218: Solid State Technology Association B-2016 Solid-State Drive(SSD) Requirements And Endurance Test Motho;


    ※ The test basis complies with JEDEC Standard No.47 NVCE: Solid State Technology Association Stress-Test-Driven Qualification of Integrated Circuits;


    ※ The design specifications of the test board meet the requirements of the industrial-grade test temperature environment;


    Information


    Inner box sizeW760×D400×H890mm
    Outer box sizeW1870×D890×H1830mm
    volume270L
    Opening methodSingle door (right open)
    cooling methodair-cooled
    weightabout 950KG
    power supplyAC 380V About 7.5 KW

    Temperature Parameter

    temperature range-70℃~150℃
    Temperature fluctuation

    ≤±0.5℃

    ≤±1℃

    temperature offset≤±2℃
    temperature resolution0.01℃
    Heating rate5℃/min(mechanical cooling, under standard load)
    temperature change rate

    High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear

    Adjustable (measured at the air outlet, mechanical cooling, under normal load)

    temperature uniformity≤±2℃
    standard load10KG aluminum block, 500W load;

    Test Standard

    GB/T5170.2-2008 Temperature test equipment


    GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.


    GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.


    GJBl50.3 (MIL-STD-810D) high temperature test method.


    GJBl50.4 (MIL-STD-810D) low temperature test method.


    Control System

    DisplayColor LCD display
    Operation modeProgram mode, fixed value mode
    SettingChinese and English menu (optional), touch screen input
    Setting rangeTemperature: Adjust according to the temperature working range of the equipment (upper limit +5°C, lower limit -5°C)

    display resolution

    Temperature: 0.01°C

    Time: 0.01min


    control method

    BTC balanced temperature control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature test equipment)

    BTHC balanced temperature and humidity control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature and humidity test equipment)


    Curve record function

    It has RAM with battery protection, which can save the set value, sampling value and sampling time of the device; the maximum recording time is 350 days (when the sampling period is 1.5min)

    Accessory function

    Fault alarm and cause, processing prompt function

    Power-off protection function

    Upper and lower limit temperature protection function

    Calendar timing function (automatic start and automatic stop operation)

    self-diagnosis function


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