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Customized High And Low Temperature Accelerated Aging Chamber

    Buy cheap Customized High And Low Temperature Accelerated Aging Chamber from wholesalers
     
    Buy cheap Customized High And Low Temperature Accelerated Aging Chamber from wholesalers
    • Buy cheap Customized High And Low Temperature Accelerated Aging Chamber from wholesalers

    Customized High And Low Temperature Accelerated Aging Chamber

    Ask Lasest Price
    Brand Name : Haida
    Model Number : HD-64-NVME
    Price : 5000-12000 USD
    Payment Terms : L/C, D/A, D/P, T/T, Western Union, MoneyGram
    Supply Ability : 150 Sets/Months
    Delivery Time : 30 Days After Order
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    Customized High And Low Temperature Accelerated Aging Chamber

    Customized High And Low Temperature Accelerated Aging Chamber


    Feature

    • Support customization of the number of PCIE test chips, such as 32 chips, 36 chips, 64 chips, 96 chips, 156 chips, 216 chips, etc.;
    • Support research and development of micro-miniature customization, such as 4 pieces, 8 pieces, etc.
    • Support (-70°~+ 180°) test
    • Support abnormal power failure test and aging test
    • Support automated temperature control testing;
    • Support all intelligent control tests with software;
    • Support customization of test software;
    • Support the balance of wind speed and temperature in the box;
    • Support rapid heating and cooling control;
    • Support customized research and development of PCIE aging;
    • Support network control, you can control the test in different places and see the test results;
    • Support APP remote control test;

    The whole machine test system mainly includes high and low temperature box, PC main board, PM board, chip board, FPGA board, product tooling, rear warehouse TEST PC and test software, etc. The hardware part.


    SSD Intelligent Test System Overview

    The intelligent test system of SSD adopts the Win10 operating system platform, through the open script mode, the temperature of the high and low temperature box and the test items of PCIE products can be modified arbitrarily, and the data transmission is carried out through the LINUX system and the network switch to realize one-button operation, networked control, saving labor, realizing intelligent data management, and permanently retaining test results.


    Information

    product modelHD-64-PCIE
    Inner box sizeW620×D450×H1100mm
    Outer box size约 W1640×D1465×H1875mm(integrated machine))
    Inner box volume460L
    Opening methodSingle door (right open)
    cooling methodair-cooled
    weightabout 900KG
    power supplyAC 220V about 6.5 KW

    Temperature Parameter

    temperature range-5℃~100℃
    Temperature fluctuation

    ≤±0.5℃

    ≤±1℃

    temperature offset≤±2℃
    temperature resolution0.01℃
    Heating rate5℃/min (mechanical cooling, under standard load)
    temperature change rate

    High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear

    Adjustable (measured at the air outlet, mechanical cooling, under normal load)

    temperature uniformity≤±2℃
    standard load10KG aluminum block, 500W load;

    Test Standard

    GB/T5170.2-2008 Temperature test equipment


    GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.


    GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.


    GJBl50.3 (MIL-STD-810D) high temperature test method.


    GJBl50.4 (MIL-STD-810D) low temperature test method.


    Control System

    DisplayColor LCD display
    Operation modeProgram mode, fixed value mode
    SettingChinese and English menu (optional), touch screen input
    Setting rangeTemperature: Adjust according to the temperature working range of the equipment (upper limit +5°C, lower limit -5°C)

    display resolution

    Temperature: 0.01°C

    Time: 0.01min


    control method

    BTC balanced temperature control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature test equipment)

    BTHC balanced temperature and humidity control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature and humidity test equipment)


    Curve record function

    It has RAM with battery protection, which can save the set value, sampling value and sampling time of the device; the maximum recording time is 350 days (when the sampling period is 1.5min)

    Accessory function

    Fault alarm and cause, processing prompt function

    Power-off protection function

    Upper and lower limit temperature protection function

    Calendar timing function (automatic start and automatic stop operation)

    self-diagnosis function


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