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Flash Memory Chip Intelligent Test Equipment Compact Size

    Buy cheap Flash Memory Chip Intelligent Test Equipment Compact Size from wholesalers
     
    Buy cheap Flash Memory Chip Intelligent Test Equipment Compact Size from wholesalers
    • Buy cheap Flash Memory Chip Intelligent Test Equipment Compact Size from wholesalers

    Flash Memory Chip Intelligent Test Equipment Compact Size

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    Brand Name : Haida
    Model Number : HD-N8-NAND
    Certification : CE,ISO
    Price : US$5,000.00-13,000.00 / Piece
    Payment Terms : L/C, D/A, D/P, T/T, Western Union, MoneyGram
    Supply Ability : 150 Sets/Months
    Delivery Time : 8 Days After Order
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    Flash Memory Chip Intelligent Test Equipment Compact Size

    Flash Memory Chip Intelligent Test System

    Product Description:

    1. The Smart Test System YC-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel.
    2. It supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test flow, highly flexible experimental test and advanced test flow, which can realize various functional tests such as remaining life prediction, the real test, data retention and read disturbance of flash memory particles. The test report can be exported quickly and easily after the completion of the test. It provides the most intuitive graphical test data to provide the most accurate reference for flash particle classification and application. It also provides the most accurate reference for flash particle classification and application and enables intelligent grading based on flash particle quality test results.


    Product Specifications:

    1. Tested by JEDEC Stand No. 218: Solid State Technology Association B-2016 Solid-State Drive (SSD) Requirements And Endurance Test Motho;
    2. Test basis following JEDEC Standard No. 47 NVCE: Solid State Technology Association Stress-TestDriven Qualification of Integrated Circuits;
    3. Test board design specifications to meet industrial-grade test temperature environment requirements;


    Technical Specifications:

    Physical properties
    Equipment sizeW400×H510×D520mm
    Power supply methodAC
    Operating voltage rangeAC(220±10%)V single-phase 2-wire + protective earth
    Normal working power consumption2KW
    Operating temperature range-30ºC~150ºC
    Storage temperature range-20ºC~60ºC
    Operating Humidity Range45%~75%
    System performance
    Number of particles that can be tested in parallel1~8 pcs
    Supported flash brands for testingSLC, MLC, TLC, Sandisk, etc. from Micron, Intel, YMTC, Hynix, Toshiba, Sandisk, etc, QLC type NAND Flash chip particles (range is being extended)
    Package sizes supportedBGA152, BGA132 (custom extensions available)
    Supported Flash Protocol TypesONFI/toggle interface particles
    Supported VoltageHardware support V1.2, V1.8 optional
    Supported Voltage Pull-Off RangeSoftware support can be fine-tuned vcc2.3~3.6
    vccq1.2 1.15~1.25
    vccq1.8 1.70~1.95
    Supports optional test rangesIndividual settings for number of starting blocks, inter-block interval, number of cycles, test time, etc.
    Support patternAll 0, all 1, all 5, pseudo-random, checkerboard grid, word line random, etc.
    Support for test command typesFlash Memory Information Inspection
    Flash Memory Performance Testing
    Life Testing and Prediction
    Quality Class Classification
    Data Interference Testing
    Data Retention Testing
    Read-Retry Functionality
    Lifetime Testing and Prediction
    ECC Customisation
    Parallel test speedAs an example of a long-lived wellington pellet base test:
    Balanced mode: 128GB *8 pellets approx. 1 hour
    Full mode: 128GB*8 pellets approx. 2 hours
    High-speed mode: 128GB*8 pellets approx. 20 minutes
    Intelligent test moduleBasic tests
    Experimental Tests
    Advanced tests


    Our Company Introduction:
    HAIDA INTERNATIONAL is a professional manufacturer of various kinds of testing equipments over 24 years. HAIDA products are widely used in paper products, packaging, ink printing, adhesive tapes, bags, footwear, leather products, environment, toys, baby products, hardware, electronic products, plastic products, rubber products and other industries, and applicable to all scientific research units, quality inspection institutions and academic fields.

    Flash Memory Chip Intelligent Test Equipment Compact Size

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